A Probabilistic Model for Soft-Error Rate Estimation in Combinational Logic
نویسندگان
چکیده
Single Event Upsets (SEU) arising from atmospheric neutrons and alpha particles are becoming increasingly important in combinational logic circuits. Combinational logic is resilient to soft errors due to three masking phenomena: (1) Logical Masking, (2) Electrical Masking, and (3) Latching-window Masking. This paper concentrates on logical masking, and proposes a probabilistic model which calculates the Soft Error Rate (SER) of any output node in combinational logic circuits, based on inherent logical masking properties.
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